SASIMI 2015

Advance program

Outline of Technical Program

March 16 (Mon.)

08:00-　 　 　Registration
08:40-09:00　(20min) Opening
09:00-10:00　(60min) Keynote 1
10:00-10:15　(15min) Coffee Break
10:15-12:00　(105min) Poster 1
12:00-13:30　(90min) Lunch
13:30-14:20　(50min) Invited Talk 1
14:20-15:50　(90min) Panel Discussion
15:50-16:10　(20min) Coffee Break
16:10-17:55　(105min) Poster 2
18:30-20:30　Banquet

March 17 (Tue.)

08:30-09:30　(60min) Keynote 2
09:30-09:45　(15min) Coffee Break
09:45-11:30　(105min) Poster 3
11:30-13:00　(90min) Lunch
13:00-13:50　(50min) Invited Talk 2
13:50-14:05　(15min) Coffee Break
14:05-14:55　(50min) Invited Talk 3
14:55-16:40　(105min) Poster 4
16:40-16:50　(10min) Closing

Highlight of the Program

• Keynote Speeches
  • Keynote 1: Vijaykrishnan Narayanan (Pennsylvania State University, USA)
    ”Influence of Emerging Devices in Revitalizing Electronic Systems Design”
  • Keynote 2: Ulf Schlichtmann (Technische Universität München, Germany)
    ”Reliability and Robustness – Design and EDA to the Rescue!”
• Invited Talks
  • Invited Talk 1: Yiyu Shi (Missouri University of Science and Technology, USA)
    ”Through-Silicon-Via Inductor based DC-DC Converters: The Marriage of the Princess and the Dragon”
  • Invited Talk 2: Tomohiro Yoneda (National Institute of Informatics, Japan)
    ”A New Approach to Synthesis of Transition Signaling Asynchronous Circuits”
  • Invited Talk 3: Hsien-Hsin Sean Lee (Taiwan Semiconductor Manufacturing Company, Taiwan)
    ”IC Design Challenges and Opportunities in Advanced Process Nodes”
• Panel Discussion
  ”Circuit Reliability: Major Roadblock in Future Technology?”

  Organizer:	Tsung-Yi Ho (NCTU, Taiwan)
  Moderator:	Ing-Chao Lin (NCKU, Taiwan)
  Panelists:	Vijaykrishnan Narayanan (PSU, USA)
  	Anthony Oates (TSMC, Taiwan)
  	Ulf Schlichtmann (TUM, Germany)
  	Yiyu Shi (Missouri S&T, USA)
  	Tomohiro Yoneda (NII, Japan)